THE CRITICAL-CURRENT DENSITY AND THE PINNING MECHANISM OF EPITAXIAL YBA2CU3O7-DELTA THIN-FILMS

Citation
Xj. Xu et al., THE CRITICAL-CURRENT DENSITY AND THE PINNING MECHANISM OF EPITAXIAL YBA2CU3O7-DELTA THIN-FILMS, Solid state communications, 93(4), 1995, pp. 291-293
Citations number
13
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
93
Issue
4
Year of publication
1995
Pages
291 - 293
Database
ISI
SICI code
0038-1098(1995)93:4<291:TCDATP>2.0.ZU;2-5
Abstract
The dependences of critical current density J(c) in the ab plane upon applied magnetic field H and the angle between the current I and H for YBa2Cu3O7-delta (YBCO) epitaxial thin film have been studied. It is i nferred that volume pinning centers play a dominant role on the basis of the law for the pinning force. analysing the forces acting on the f lux line in the critical state, we suggest that the Lorentz force is n ot the only driving force for the motion of flux lines. In the H // I case, the decrease of critical current density J(c) with increasing H is due to a suppression of the superconductivity by the applied field. The behavior of the critical current density can be well described by the anisotropic Kim-Anderson model.