SUPERCONDUCTIVITY OF LANTHANUM SILICIDE THIN-FILMS

Citation
A. Travlos et N. Salamouras, SUPERCONDUCTIVITY OF LANTHANUM SILICIDE THIN-FILMS, Vacuum, 48(1), 1997, pp. 13-14
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
VacuumACNP
ISSN journal
0042207X
Volume
48
Issue
1
Year of publication
1997
Pages
13 - 14
Database
ISI
SICI code
0042-207X(1997)48:1<13:SOLST>2.0.ZU;2-P
Abstract
Thin films of LaSi2-x, prepared by solid phase reaction of La with Si substrates in vacuum, have been studied using X-ray diffraction and el ectron microscopy. Their electrical resistivity was measured as a func tion of temperature from 1.6 to 300 K. The LaSi2-x layers were found t o be metallic with a superconductive transition at 2-5 K. Copyright (C ) 1996 Elsevier Science Ltd.