FIRST STRUCTURAL CHARACTERIZATION OF SILICON-ARSENIC AND SILICON-PHOSPHORUS MULTIPLE BONDS IN SILYLATED SILYLIDENE-ARSANES AND SILYLIDENE-PHOSPHANES - X-RAY STRUCTURE OF A TELLURA-ARSASILIRANE DERIVATIVE

Authors
DRIESS M RELL S PRITZKOW H
Citation
M. Driess et al., FIRST STRUCTURAL CHARACTERIZATION OF SILICON-ARSENIC AND SILICON-PHOSPHORUS MULTIPLE BONDS IN SILYLATED SILYLIDENE-ARSANES AND SILYLIDENE-PHOSPHANES - X-RAY STRUCTURE OF A TELLURA-ARSASILIRANE DERIVATIVE, Journal of the Chemical Society, Chemical Communications, (2), 1995, pp. 253-254
Citations number
21
Categorie Soggetti
Chemistry
Journal title
Journal of the Chemical Society, Chemical Communications → ACNP
ISSN journal
00224936
Issue
2
Year of publication
1995
Pages
253 - 254
Database
ISI
SICI code
0022-4936(1995):2<253:FSCOSA>2.0.ZU;2-2
Abstract
The molecular structures of the t-butyl-1-isityl-3,3,3-triisopropyldis ilaphosphene 4 (isityl = 2,4,6-triisopropylphenyl), the analogous disi laarsene 5, and the corresponding tellura-arsasilirane 6 (formed by re action of 5 with elemental tellurium) are established by X-ray crystal lographic analysis.