A STUDY OF SURFACE MODIFICATION OF SILICA USING XPS, DRIFT AND NMR

Citation
F. Garbassi et al., A STUDY OF SURFACE MODIFICATION OF SILICA USING XPS, DRIFT AND NMR, Applied surface science, 84(2), 1995, pp. 145-151
Citations number
26
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
84
Issue
2
Year of publication
1995
Pages
145 - 151
Database
ISI
SICI code
0169-4332(1995)84:2<145:ASOSMO>2.0.ZU;2-E
Abstract
Silica has been treated in a slurry with several chloromethylsilanes a nd SiCl4. After treatment, the surfaces were characterized by XPS, DRI FT and Si-27-MAS NMR. The following reactivity scale was determined: T MCS > DCDMS > MTCS > TCS. XPS was found to be a very useful technique to complement NMR and vibrational spectroscopies, mainly from a quanti tative point of view.