MINIMUM AVERAGE COST TESTING FOR PARTIALLY ORDERED COMPONENTS

Authors
LIPMAN MJ ABRAHAMS J
Citation
Mj. Lipman et J. Abrahams, MINIMUM AVERAGE COST TESTING FOR PARTIALLY ORDERED COMPONENTS, IEEE transactions on information theory, 41(1), 1995, pp. 287-291
Citations number
12
Categorie Soggetti
Information Science & Library Science","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on information theory → ACNP
ISSN journal
00189448
Volume
41
Issue
1
Year of publication
1995
Pages
287 - 291
Database
ISI
SICI code
0018-9448(1995)41:1<287:MACTFP>2.0.ZU;2-J
Abstract
The problem of designing a sequence of optimal binary tests for the id entification of a single faulty component is addressed. For components in linear order this is equivalent to the classical alphabetic coding problem solved by Hu and Tucker. For partially ordered components the problem is solved by reduction to a minimization over a set of alphab etic problems.