S. Tokito et al., THE MOLECULAR-ORIENTATION IN COPPER PHTHALOCYANINE THIN-FILMS DEPOSITED ON METAL-FILM SURFACES, Thin solid films, 256(1-2), 1995, pp. 182-185
The molecular orientation in copper phthalocyanine (CuPc) films deposi
ted on metal films of Au, Ag, Cu and Cr has been studied by reflection
-absorption infrared spectroscopy and X-ray diffraction. The molecular
planes of CuPc in the ultra-thin films (corresponding to several tens
of monolayers) deposited on Au, Ag and Cu films were found to be near
ly parallel to the metal film surfaces. Further deposition (up to 100
nm) on such thin films produces a molecular orientation with the molec
ular planes inclined away from the metal film surfaces. This correspon
ds to a crystal structure of the a phase with alpha standing b axis co
nfiguration. However, the molecular planes of the CuPc deposited on Cr
films are rather perpendicular to the Cr film surfaces. These CuPc fi
lms are in the alpha phase with a parallel b axis configuration.