THE MOLECULAR-ORIENTATION IN COPPER PHTHALOCYANINE THIN-FILMS DEPOSITED ON METAL-FILM SURFACES

Citation
S. Tokito et al., THE MOLECULAR-ORIENTATION IN COPPER PHTHALOCYANINE THIN-FILMS DEPOSITED ON METAL-FILM SURFACES, Thin solid films, 256(1-2), 1995, pp. 182-185
Citations number
17
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
256
Issue
1-2
Year of publication
1995
Pages
182 - 185
Database
ISI
SICI code
0040-6090(1995)256:1-2<182:TMICPT>2.0.ZU;2-I
Abstract
The molecular orientation in copper phthalocyanine (CuPc) films deposi ted on metal films of Au, Ag, Cu and Cr has been studied by reflection -absorption infrared spectroscopy and X-ray diffraction. The molecular planes of CuPc in the ultra-thin films (corresponding to several tens of monolayers) deposited on Au, Ag and Cu films were found to be near ly parallel to the metal film surfaces. Further deposition (up to 100 nm) on such thin films produces a molecular orientation with the molec ular planes inclined away from the metal film surfaces. This correspon ds to a crystal structure of the a phase with alpha standing b axis co nfiguration. However, the molecular planes of the CuPc deposited on Cr films are rather perpendicular to the Cr film surfaces. These CuPc fi lms are in the alpha phase with a parallel b axis configuration.