X-RAY-DIFFRACTION FROM SI GE LAYERS - DIFFUSE-SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/

Authors
SCHLOMKA JP TOLAN M SCHWALOWSKY L SEECK OH STETTNER J PRESS W
Citation
Jp. Schlomka et al., X-RAY-DIFFRACTION FROM SI GE LAYERS - DIFFUSE-SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/, Physical review. B, Condensed matter, 51(4), 1995, pp. 2311-2321
Citations number
49
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
51
Issue
4
Year of publication
1995
Pages
2311 - 2321
Database
ISI
SICI code
0163-1829(1995)51:4<2311:XFSGL->2.0.ZU;2-Y