J. Trincavelli et R. Vangrieken, PEAK-TO-BACKGROUND METHOD FOR STANDARDLESS ELECTRON-MICROPROBE ANALYSIS OF PARTICLES, X-ray spectrometry, 23(6), 1994, pp. 254-260
A peak-to-background method was implemented for standardless electron
microprobe analysis of bulk samples and particles. First, a study on t
he choice of the beam entry point was performed; the region of the par
ticle closest to the detector proved to be the most convenient. Then,
a very simple algorithm, which does not require any kind of standard,
was developed for particle analysis. This method was tested for glass
standard particles and the results were compared with those given by o
ther methods; the proposed standardless approach appeared to yield ver
y satisfactory results.