STRUCTURAL AND CRITICAL BEHAVIORS OF AG ROUGH FILMS DEPOSITED ON LIQUID SUBSTRATES

Authors
YE GX GENG CM ZHANG ZR GE HL ZHANG XJ
Citation
Gx. Ye et al., STRUCTURAL AND CRITICAL BEHAVIORS OF AG ROUGH FILMS DEPOSITED ON LIQUID SUBSTRATES, Chinese Physics Letters, 13(10), 1996, pp. 772-774
Citations number
6
Categorie Soggetti
Physics
Journal title
Chinese Physics Letters → ACNP
ISSN journal
0256307X
Volume
13
Issue
10
Year of publication
1996
Pages
772 - 774
Database
ISI
SICI code
0256-307X(1996)13:10<772:SACBOA>2.0.ZU;2-L
Abstract
A new Ag rough film system. deposited on silicone oil surfaces by rf-m agnetron sputtering method, has been fabricated. The chrysanthemum-lik e surface morphology at micron length scale is observed, It is propose d that the anomalous critical behavior mainly results from the relativ e shift between the Ag atom clusters and the substrate. The discussion of the deposition mechanism is also presented.