This paper deals with the general theory of the long- and short-term d
ielectric strength of solid dielectrics. Well known theories of dielec
tric strength are analysed. The need, in the theory, to allow for the
thermal fluctuations of dielectric atoms and local electromechanical f
orces, which increase approximately by an order of magnitude on accoun
t of the presence of microparticles and narrow pores in the dielectric
, is shown. Formulae for calculating the dielectric strength and life
of solid dielectrics, taking into account thermal fluctuations and loc
al electromechanical forces, are given. Calculations by means of the f
ormulae are compared with experimental data at various temperatures.