QUANTITATIVE-ANALYSIS OF METAL-ALLOYS BASED ON THE TOTAL X-RAY PHOTOELECTRON-SPECTRA

The method for quantitative XPS analysis proposed by Wertheim was used in the present work to check the composition of Ni-Mo alloys. These a lloys had already been studied by the usual analysis based on the main line intensities. Both methods provided practically the same results. The sensitivity factor in these alloys is not constant, owing to chan ges of the crystal structure in the studied composition range. The tot al signal analysis offered a very quick method to estimate the alloy c omposition from only the wide spectrum measurement but it does not eli minate the problem of sensitivity factors, at least in the case of mix ed-phase alloys. This method is not influenced by satellites but still is sensitive to the changes of surface composition induced by sputter ing.