IMAGING OF LOCAL THERMAL AND ELECTRICAL-CONDUCTIVITY WITH SCANNING FORCE MICROSCOPY

The evaluation of thermal and electrical properties has been demonstra ted using a scanning force microscope under ambient air condition. For the first time, the investigation of thermal conductivity on a chemic al vapor deposited (CVD) grown diamond surface has been performed with a lateral resolution below 200 nm. Depending on the growing parameter s, structures consisting of lines of different thicknesses and spacing s are visible. The determination of the electrical structure has been carried out with a resolution of 2 nm using the contact current mode ( CCM) showing similar structures. The thermal images exhibit a high the rmal conductivity mostly on the diamond crystals whereas the electrica l conductivity reached its highest values between them.