STEREOMETRY OF CRYSTALLINE PHASES OBSERVED IN SCANNING ELECTRON-MICROSCOPY

A study of edges and angles of known samples has been performed by mea ns of stereoscopic pairs with electron microscopy in two and three dim ensional systems. The derived equations have been included in a comput er program. Measurements on stereoscopic pairs with different tilt ang les using several crystals of galena, calcite and other objects with k nown dimensions have been performed. The optimum tilt angeles have bee n obtained by comparison with the actual values, and a logarithmic rat io between these angles and the stereoscopic pairs magnification has b een found. The errors obtained using this system of calculation are lo wer than 6 % in the measure of angles and 15 % in the case of edges.