PHYSICAL CHARACTERIZATION OF PB1ZR0.2TI0.8O3 PREPARED BY THE SOL-GEL PROCESS

We have used Auger electron spectroscopy (AES), x-ray photoelectron sp ectroscopy (XPS), Raman spectroscopy, and Rutherford backscattering sp ectroscopy (RBS) to characterize lead zirconate-lead titanate (PbZrO3- PbTiO3) of stoichiometry Pb1Zr0.2Ti0.8O3 prepared by the sol-gel proce ss. The films were deposited on a sputtered film of Pt and annealed at 700 degrees C 30 mm. Dramatic AES and XPS chemical effects are observ ed in the film due to charge transfer between Ti and Zr and O; the bin ding energy of the PZT XPS Ti2p(3/2) (Zr3d(5/2)) orbital shifts +5.2 e V (+4.3 eV) compared to the element and substantial shape changes are observed in the AES Ti(LMM) and O(KLL) peaks. Raman spectroscopy at bo th 300 and 80 K show that mode frequencies shift upward with decreasin g temperature in accord with soft mode theory. Rutherford backscatteri ng spectroscopy (RBS) indicates that the stoichiometry of Pb1Zr0.2Ti0. 8O3, on Pt changes little during 700 degrees C thermal annealing in ox ygen because the oxygen from the gas phase replaces the oxygen lost to the substrate by thermal diffusion.