MULTILAYER DIAMOND-LIKE STRUCTURES FOR X-RAY OPTICS

A new type of multilayer interference structures for X-ray optics cons isting of alternating carbon layers with different parameters is propo sed. The properties of carbon films and multilayer carbon structures w ere investigated by X-ray diffraction measurements. The numerical comp utations of reflecting ability of multilayer carbon structures with an ideally smooth interface and with roughness of the individual layers were carried out. It was found that intensity of the calculated first Bragg peak was much too high compared with the experiment. That is the consequence of both the interface roughness and the random fluctuatio n in layer thicknesses.