The electronic band structure of a newly characterized polysilane (Si6
H6) Sheet has been studied with Hartree-Fock and local density-functio
nal calculations. A direct band gap was found with a calculated absorp
tion edge at 3 eV. Layered structures (Si6nH6) With thicker Si sheet c
ores can be constructed by linking several layers followed by hydrogen
termination of the exposed surfaces. The multiply linked materials ar
e found to develop a weak indirect band gap approaching that of bulk s
ilicon as the number of layers increases. The observed band-gap variat
ion in hydrogen-passivated porous silicon (p-Si) may be related by rec
ognizing that the p-Si is made of cross-linking Si sheet structures (S
i6nH6) whose Si core thickness (n) varies with preparation conditions.