MICRODEFECTS IN TE-DOPED GAAS

Citation
Vt. Bublik et Kd. Shcherbachev, MICRODEFECTS IN TE-DOPED GAAS, Kristallografia, 40(1), 1995, pp. 122-127
Citations number
12
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00234761
Volume
40
Issue
1
Year of publication
1995
Pages
122 - 127
Database
ISI
SICI code
0023-4761(1995)40:1<122:MITG>2.0.ZU;2-B