MEASUREMENT OF ABSOLUTE STOPPING CROSS-SECTIONS BY BACKSCATTERING IN THIN DIELECTRIC FILMS

Authors
KHAWAJA EE DURRANI SMA HALLAK AB DAOUS MA
Citation
Ee. Khawaja et al., MEASUREMENT OF ABSOLUTE STOPPING CROSS-SECTIONS BY BACKSCATTERING IN THIN DIELECTRIC FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 95(2), 1995, pp. 153-157
Citations number
19
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
95
Issue
2
Year of publication
1995
Pages
153 - 157
Database
ISI
SICI code
0168-583X(1995)95:2<153:MOASCB>2.0.ZU;2-#
Abstract
The present work deals with a different approach to the existing metho d of backscattering in determining absolute stopping cross sections of light ions in thin dielectric films. In this method, the uncertain mo lecular density (molecules/cm3) of the film is replaced (using the Lor entz-Lorenz law) by refractive index of the film, refractive index and the molecular density of the corresponding bulk material, which may b e known with better reliability. The method has been applied successfu lly to a study of the stopping cross sections of He2+ in thin films of MoO3, TiO2, Ge, ZnSe and ZnS.