SOFT-X-RAY SCANNING MICROTOMOGRAPHY WITH SUBMICROMETER RESOLUTION

Authors
MCNULTY I HADDAD WS TREBES JE ANDERSON EH
Citation
I. Mcnulty et al., SOFT-X-RAY SCANNING MICROTOMOGRAPHY WITH SUBMICROMETER RESOLUTION, Review of scientific instruments, 66(2), 1995, pp. 1431-1433
Citations number
13
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
66
Issue
2
Year of publication
1995
Part
2
Pages
1431 - 1433
Database
ISI
SICI code
0034-6748(1995)66:2<1431:SSMWSR>2.0.ZU;2-9