PROTOTYPE GROOVED AND SPHERICALLY BENT SI BACKSCATTERING CRYSTAL ANALYZER FOR MEV RESOLUTION INELASTIC X-RAY-SCATTERING

Authors
BLASDELL RC MACRANDER AT
Citation
Rc. Blasdell et At. Macrander, PROTOTYPE GROOVED AND SPHERICALLY BENT SI BACKSCATTERING CRYSTAL ANALYZER FOR MEV RESOLUTION INELASTIC X-RAY-SCATTERING, Review of scientific instruments, 66(2), 1995, pp. 2075-2077
Citations number
8
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
66
Issue
2
Year of publication
1995
Part
2
Pages
2075 - 2077
Database
ISI
SICI code
0034-6748(1995)66:2<2075:PGASBS>2.0.ZU;2-Y