SHEAR FORCE MICROSCOPY WITH CAPACITANCE DETECTION FOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY

Authors
LEONG JK WILLIAMS CC
Citation
Jk. Leong et Cc. Williams, SHEAR FORCE MICROSCOPY WITH CAPACITANCE DETECTION FOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Applied physics letters, 66(11), 1995, pp. 1432-1434
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
11
Year of publication
1995
Pages
1432 - 1434
Database
ISI
SICI code
0003-6951(1995)66:11<1432:SFMWCD>2.0.ZU;2-4