MODERATE KINK EFFECT IN FULLY DEPLETED THIN-FILM SOI MOSFETS

Citation
F. Balestra et al., MODERATE KINK EFFECT IN FULLY DEPLETED THIN-FILM SOI MOSFETS, Electronics Letters, 31(4), 1995, pp. 326-327
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
31
Issue
4
Year of publication
1995
Pages
326 - 327
Database
ISI
SICI code
0013-5194(1995)31:4<326:MKEIFD>2.0.ZU;2-J
Abstract
Floating body effects are investigated in thin-film SOI MOSFETs. it is shown that a moderate kink effect can be obtained for fully depleted SOT devices with intermediate Si layer thicknesses. This moderate kink is due to the significant potential barrier height of the source/thin film diode, which can be modulated by the additional forward bias ind uced by the impact ionisation current, for these moderately fully depl eted devices. Various substrate and body biases are applied in order t o analyse the transition from partial depletion to strong full depleti on regimes.