XPS ANALYSIS OF THERMAL AND PLASMA-TREATED POLYPARAPHENYLENE-VINYLENETHIN-FILMS AND THEIR INTERFACE FORMED WITH ALUMINUM LAYER

X-ray photoelectron spectroscopy (XPS) was used to investigate the int erface formed between thermally and plasma neared polyparaphenylene-vi nylene thin films and an aluminium layer deposited on them. Enhancemen t in adhesion of the metal on thermally treated polymer films is expla ined by the structural change of aluminum layer. In contrast, plasma t reatments induce morphological modifications of the polymer surface an d favor the formation of compounds between the polymer and the metal w hich in turn improve the adhesive strength.