Mv. Weckwerth et al., EPOXY BOND AND STOP-ETCH (EBASE) TECHNIQUE ENABLING BACKSIDE PROCESSING OF (AL)GAAS HETEROSTRUCTURES, Superlattices and microstructures, 20(4), 1996, pp. 561-567
The epoxy bond and stop-etch (EBASE) technique enables both the fronts
ide and the backside processing of very thin (similar to 3000 Angstrom
) GaAs/AlGaAs epitaxial layer structures. Using this technique, a conv
entionally processed epitaxial layer structure is inverted and epoxied
to a new host substrate. The original substrate is removed leaving on
ly the original epitaxial structure expoxied to the host substrate. Th
e exposed backside of the epitaxial structure may then be processed. B
ecause the structures fabricated using this technique are so thin, mes
as, Schottky gates, and ohmic contacts may be defined in close proximi
ty both above and below the active device layers. (C) 1996 Academic Pr
ess Limited