PROPAGATION LENGTH OF LONG-RANGE SURFACE OPTIC WAVES IN ISLANDIZED SILVER FILMS

The propagation length L of long-range surface optic waves in islandiz ed Ag films sandwiched by identical dielectrics at a wavelength of 632 .8 nm has been measured. Two measurement methods were adopted: (i) an attenuated total reflection (ATR) method, and (ii) a method involving measuring the spatial distribution of the reflected intensity in an AT R geometry. By using both methods, a value for L of similar to 480 mu m was obtained fora mass thickness of 2.7 nm.