E. Ettedgui et al., X-RAY PHOTOEMISSION SPECTROSCOPY STUDY OF BAND BENDING AT THE INTERFACE OF METAL WITH POLY(P-PHENYLENE VINYLENE), Surface and interface analysis, 23(2), 1995, pp. 89-98
We report on our recent x-ray photoemission spectroscopy investigation
s of the interface formation of metals with poly(p-phenylene vinylene)
(PPV) prepared under various conditions. We have found that during de
position tbe metal reacts with residual hydroxyl groups in the polymer
. In addition, we have found that Schottky barrier formation and the a
ssociated bad bending depend strongly on surface preparation. in the c
ase of Al deposition, samples converted in situ, containing 5% surface
oxygen, show band bending that depends on the thickness of the metal
overlayer, with effects arising after as little as 1 Angstrom of metal
. On the other hand, a sample converted ex situ, with 10% surface oxyg
en, is insensitive to aluminium deposition. We feel that surface impur
ities and adsorbed species may delay Schottky barrier formation by act
ing as a buffer layer that prevents the PPV substrate from interacting
with the growing layer of Al. By contrast, the Ca/PPV surface exhibit
s delayed band bending, with strong interactions between surface oxyge
n and Ca, Our results indicate that band bending at the metal/PPV inte
rface is governed by the metallicity of the metal overlayer, which its
elf is influenced by the interface reaction of the deposited metal wit
h the PPV substrate or the surface residual impurities. Finally, the d
egree of band bending observed did not correlate directly with the dif
ferences in work functions between the metals and PPV.