CHARACTERIZATION OF A POINT-CONTACT ON SILICON USING FORCE MICROSCOPY-SUPPORTED RESISTANCE MEASUREMENTS

Authors
DEWOLF P SNAUWAERT J CLARYSSE T VANDERVORST W HELLEMANS L
Citation
P. Dewolf et al., CHARACTERIZATION OF A POINT-CONTACT ON SILICON USING FORCE MICROSCOPY-SUPPORTED RESISTANCE MEASUREMENTS, Applied physics letters, 66(12), 1995, pp. 1530-1532
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
12
Year of publication
1995
Pages
1530 - 1532
Database
ISI
SICI code
0003-6951(1995)66:12<1530:COAPOS>2.0.ZU;2-4