SPECTROSCOPIC ELLIPSOMETRY STUDIES OF INDIUM PHTHALOCYANINE FILMS

Spectroscopic ellipsometry measurements are employed to investigate va cuum sublimed indium phthalocyanine (InPc) thin films on single-crysta l silicon by a new type of scanning photometric ellipsometer in which the analyser and polarizer rotate synchronously. The complex dielectri c function and optical constants of the film are obtained in the wavel ength range 550 to 800 nm. It is found that there is a comparatively l arge absorption region at 600 to 800 nm for vacuum sublimed InPc film and the exciton coupling greatly influences its absorption spectrum.