X-RAY-INVESTIGATIONS OF DISLOCATIONS IN AN IMPLANTED SI CRYSTAL-INDUCED BY PULSED-LASER ANNEALING

Citation
J. Auleytner et al., X-RAY-INVESTIGATIONS OF DISLOCATIONS IN AN IMPLANTED SI CRYSTAL-INDUCED BY PULSED-LASER ANNEALING, Physica status solidi. a, Applied research, 147(2), 1995, pp. 69-71
Citations number
3
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
147
Issue
2
Year of publication
1995
Pages
69 - 71
Database
ISI
SICI code
0031-8965(1995)147:2<69:XODIAI>2.0.ZU;2-K