Conversion Electron Mossbauer Spectroscopy (GEMS) studies were carried
out on as deposited and annealed Fe/Ni multilayers prepared by rf spu
ttering, in order to probe the interface. A series of multilayers in w
hich Ni layer thickness was fixed at 25 Angstrom and the Fe layer thic
kness was varied from 18 to 120 Angstrom, were studied. The width of t
he Mossbauer lines increases with decreasing Fe layer thickness indica
ting a mixing at the interface, which was analyzed using specific mode
ls.