SPONTANEOUS FORMATION OF AMORPHOUS PHASE AT NI ZR INTERFACE/

Citation
T. Lucinski et al., SPONTANEOUS FORMATION OF AMORPHOUS PHASE AT NI ZR INTERFACE/, Journal of magnetism and magnetic materials, 144, 1995, pp. 595-596
Citations number
11
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
03048853
Volume
144
Year of publication
1995
Part
1
Pages
595 - 596
Database
ISI
SICI code
0304-8853(1995)144:<595:SFOAPA>2.0.ZU;2-Z
Abstract
Formation of an amorphous phase in multilayered Ni/Zr films has been s tudied on the basis of resistivity measurements. The obtained dependen cies of resistivity on the wavelength of modulation for as-deposited f ilms as well as on time, under isothermal annealing, have been shown t o be well described by a planar model of film growth.