Recently we have shown that M-type Sr ferrite films (SrM) can be sputt
er deposited on fused amorphous quartz substrates with c-axis normal t
o the film plane [1]. In the present study we show that the c-axis ori
entation of SrM on Si(111) can be tailored to vary from in plane to no
rmal to the film plane by changing the deposition parameters.