Hexagonal close-packed (HCP) C-60 and C-70 films have been prepared by
the Langmuir method and examined by electron microscopy and electron-
diffraction analysis. It has been shown that the vacuum deposition of
a C-60 + C-70 mixture results in the formation of a film with small si
zed grains and a distorted C-60-HCP structure. The simultaneous deposi
tion of C-60 and ferrocene results in the formation of a film with a c
hanged morphology and an electron-diffraction pattern that contains a
variable amount of ferrocene depending on the experimental conditions.
The electron-diffraction pattern corresponds to the presence of the k
nown molecular complex C-60[(C5H5)(2)Fe](2). The analogous simultaneou
s deposition of fullerene C-60 and cobaltocene results in the formatio
n of a C-60 film stable in air and water, which contains carbon and co
balt (from the data of X-ray fluorescence, electron microscopy and mic
rodiffraction). It has a different morphology and different diffractio
n patterns than pure C-60 films and, depending on the cobaltocene cont
ent (relative to that of fullerene), appears to be a fullerite film do
ped with various amounts of cobaltocenium fulleride, which is an ionic
compound.