THE REMOVAL OF HARD MASKS IN SEMICONDUCTOR PROCESSING

Citation
Jf. Rembetski et al., THE REMOVAL OF HARD MASKS IN SEMICONDUCTOR PROCESSING, Solid state technology, 38(3), 1995, pp. 67-72
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
0038111X
Volume
38
Issue
3
Year of publication
1995
Pages
67 - 72
Database
ISI
SICI code
0038-111X(1995)38:3<67:TROHMI>2.0.ZU;2-K
Abstract
Semiconductor fabrication relies on masking layers to protect underlyi ng structures in many operations. The familiar photolithographic soft masks are primarily composed of organic materials. Hard masks, like th e SiN layer used in local oxidation (LOCOS), are mainly inorganic and are able to withstand more severe process environments. Thus, they req uire unique removal techniques. This article discusses wet and dry har d mask stripping methods.