S. Moffatt, ION-IMPLANTATION FROM THE PAST AND INTO THE FUTURE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 1-6
This paper is a view of the past, present and future of ion implantati
on equipment. From the discovery of charged particles in the last cent
ury, a set of apparatus has evolved for processing silicon by implanti
ng several dopant species. The equipment is now standardized into two
forms (serial medium, batch high) and produced by several major manufa
cturers. The technical requirements for device shrinkage in the next s
everal generations of silicon products will focus technical ion beam e
fforts on lower energy implants with more stable high current beams. T
he fundamental change however lies in the market for silicon which is
becoming totally dominated by consumer products (such as PCs); the rel
entless drive for lower cost memory and soon in microprocessors will f
orce implanters to increase ''ions into silicon''.