Me. Mack et al., PARTICLE GENERATION IN ION IMPLANTERS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 80-86
Optical elements at potential represent a serious concern for particle
generation in ion implanters. Conditioning of acceleration columns is
a well known phenomenon in accelerators but less well known is the fa
ct that the microdischarging, which accompanies the conditioning proce
ss, results in high particle production. Ad elements at voltage will e
xhibit microdischarging, but careful design can greatly reduce it and
control the associated particle generation. Moreover, microdischarging
can be detected, so that the implanter control system can detect and
interlock recipes against microdischarge generated particulate contami
nation.