A. Claverie et al., SYNTHESIS OF SEMIINSULATING GAAS BY AS IMPLANTATION AND THERMAL ANNEALING - STRUCTURAL AND ELECTRICAL-PROPERTIES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 327-330
High dose As implantation in GaAs followed by annealing at 600 degrees
C results in the formation of semi-insulating GaAs layers. These laye
rs are relaxed with a homogeneous distribution of metallic As precipit
ates similarly to what is observed in GaAs grown by molecular beam epi
taxy at about 200 degrees C (LT-MBE-GaAs), after annealing at 600 degr
ees C. By selecting the implantation parameters it is possible to adju
st the thickness of the subsequent SI layer and to monitor the amount
of excess As in the crystal. By selecting the annealing temperature it
is possible to fabricate either a material very similar to the as-gro
wn LT-MBE-GaAs or a material similar to annealed LT-MBE-GaAs.