STUDY AND IMPROVEMENT OF THE ADHESION OF CHROMIUM THIN-FILMS DEPOSITED BY MAGNETRON SPUTTERING

Citation
V. Guilbaudmassereau et al., STUDY AND IMPROVEMENT OF THE ADHESION OF CHROMIUM THIN-FILMS DEPOSITED BY MAGNETRON SPUTTERING, Thin solid films, 258(1-2), 1995, pp. 185-193
Citations number
23
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
258
Issue
1-2
Year of publication
1995
Pages
185 - 193
Database
ISI
SICI code
0040-6090(1995)258:1-2<185:SAIOTA>2.0.ZU;2-U
Abstract
Pure and doped chromium coatings are deposited on glass substrates by magnetron sputtering. By varying the reactive gas content, tensile int rinsic stress transitions to compressive ones are observed. Scratch te sts have demonstrated a good adhesion for doped chromium coatings whic h are in a compressive state. Doped nitrogen chromium films have the h ighest values of the critical load at which adhesion fails (17 N). Pur e chromium coatings are in tensile stresses and the critical value is only 11 N. Adhesion and intrinsic stress dependences are shown. These results are correlated with average crystallographic grain size, prefe rential crystalline orientation, morphology and microhardness.