X-ray diffraction measurements on thin films of poly(hexyl-pentylsilan
e) cast on silicon substrates are presented. The polymer chains pack i
n a hexagonal lattice which is oriented such that the chains lie paral
lel to the surface. In addition, a remarkable degree of orientational
order was found with the planes containing the neighbor molecules lyin
g in the surface plane. Parallel to the film surface, the average crys
talline size is 600 angstrom, while perpendicular to the surface, ther
e is nearly perfect interchain stacking of the polymers throughout the
thickness of the film.