THE FIRST HIGH-RESOLUTION, BROAD-BAND X-RAY SPECTROSCOPY OF ION-SURFACE INTERACTIONS USING A MICROCALORIMETER

Authors
LEGROS M SILVER E SCHNEIDER D MCDONALD J BARDIN S SCHUCH R MADDEN N BEEMAN J
Citation
M. Legros et al., THE FIRST HIGH-RESOLUTION, BROAD-BAND X-RAY SPECTROSCOPY OF ION-SURFACE INTERACTIONS USING A MICROCALORIMETER, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 357(1), 1995, pp. 110-114
Citations number
20
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
357
Issue
1
Year of publication
1995
Pages
110 - 114
Database
ISI
SICI code
0168-9002(1995)357:1<110:TFHBXS>2.0.ZU;2-6
Abstract
A high resolution, broad band X-ray microcalorimeter has been used for the first time to investigate the radiative deexcitation of highly ch arged 7 keV/q Ar17+ ions as they interact with a beryllium surface at normal incidence. The 20 eV energy resolution of this instrument made it possible to clearly distinguish the argon K-alpha and K-beta,K-gamm a complex simultaneously. The intensity ratio of the K-beta,K-gamma to K-alpha emission is 31%, compared to the 8% found in the neutral argo n atom. There is strong evidence that the relative intensities of the KL(n) (n = 1-8) transitions do not agree with those obtained with crys tal spectrometers.