S. Stemmer et al., THE INFLUENCE OF PT AND SRTIO3 INTERLAYERS ON THE MICROSTRUCTURE OF PBTIO3 THIN-FILMS DEPOSITED BY LASER-ABLATION ON (001) MGO, Journal of materials research, 10(4), 1995, pp. 791-794
We have used conventional and high-resolution transmission electron mi
croscopy to investigate the microstructure of epitaxial, ferroelectric
PbTiO3 films grown by pulsed laser ablation on (001) MgO single cryst
als, and on MgO covered with epitaxial Pt or SrTiO3. Pronounced variat
ions are found in the widths and lengths of a-axis-oriented domains in
these films, although the volume fraction of a-axis-oriented material
varies only weakly for the different types of samples. In addition, t
he films deposited onto Pt-coated MgO have a larger grain size than th
ose deposited onto bare MgO or SrTiO3/MgO. Possible reasons for the va
riations in the distribution of a-axis-oriented material in these samp
les include differences in the elastic properties and electrical condu
ctivities of the different substrate combinations.