Vn. Kaliakin, INSIGHT INTO DEFICIENCIES ASSOCIATED WITH COMMONLY USED ZERO-THICKNESS INTERFACE ELEMENTS, Computers and geotechnics, 17(2), 1995, pp. 225-252
Although they are widely used in the finite element analysis of geolog
ic structures, zero-thickness interface elements possess certain funda
mental deficiencies. In particular, spurious stress oscillations attri
buted to inappropriate quadrature schemes, lack of accuracy due to exc
essively large stiffness parameters, and inaccurate interface stress p
redictions due to insufficient mesh fineness have been cited in the pa
st. In this paper the performance of two commonly used linear zero-thi
ckness interface elements is examined in detail. Behavioral deficienci
es that have not appeared in the literature are identified. Although s
ome of these deficiencies are similar to phenomena previously noted fo
r such elements, in the present case they are attributed to different
factors. An improved linear zero-thickness interface element that over
comes the aforementioned deficiencies is developed and its predictive
capabilities critically assessed.