Karnal bunt caused by Tilletia indica in wheat seriously affects the q
uality of the grains. It is important to generate information on the g
enetics of resistance to this pathogen so as to aid resistance breedin
g. For this purpose, four Karnal bunt-resistant lines from China, Braz
il and CIMMYT (International Maize and Wheat Improvement Center) and a
susceptible Indian cultivar, WL711, were used. The parents, F1 and F3
progenies of five parental diallel crosses revealed that independentl
y segregating loci with three partial dominant resistance alleles were
involved in the resistance of Karnal bunt. Lines RC7201/2BR2 and Roe
k/Maya/NAC carried one locus for resistance while Shanghai#7 and Aldan
/IAS58 have two and three loci, respectively. One common locus was pre
sent in all four resistant parents, which imparted a high level of res
istance.