Yd. Kim et al., OBSERVATION OF CO2-XCOXSE THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY( INTRAION TRANSITIONS IN ZN1), Journal of the Korean Physical Society, 28, 1995, pp. 80-83
We report the first ellipsometric observation of an optical transition
associated with the crystal field levels in the localized d-states. I
n the ellipsometric spectra of Zn1-xCoxSe films with 0.04 less than or
equal to x<0.1 grown on GaAs substrates, sharp distortions of the int
erference patterns below the fundamental band gap were observed at ene
rgies between 1.6 similar to 1.9 eV. To understand this, we calculated
multilayer model (air/Zn1-xCoxSe/GaAs). The dielectric function of th
e film is approximated by using harmonic oscillator model with two osc
illators with transition energies at 1.67 and 1.83 eV. The calculated
pseudodielectric function shows the same behavior as our measured pseu
dodielectric response, resulting that our da:a shows the clear existen
ce of the absorptions due to intra d to d transitions of Co2+ ions und
er a tetrahedral crystal field.