INDEX OF REFRACTION OF AG-DOPED AS33S67 FILMS - MEASUREMENT AND ANALYSIS OF DISPERSION

We report data on the dispersion of the index of refraction of silver- doped As33 S67 thin films in the visible and near-infrared regions. Th e measured data is analysed on the basis of a single-effective-oscilla tor model proposed by Wemple and DiDomenico. The silver content depend ence of the oscillator energy E0 seems to vary in proportion to optica l gap E(g)opt of the sample, whereas the dispersion energy or oscillat or strength E(d) increases with increasing silver content. This latter fact indicates that the effective coordination of the cation increase s as silver is incorporated into the chalcogenide host matrix.