W. Bala et al., PHOTOLUMINESCENCE, REFLECTIVITY AND RAMAN INVESTIGATIONS OF NANOCRYSTALLITES IN LUMINESCENT POROUS SILICON, Acta Physica Polonica. A, 87(2), 1995, pp. 445-448
Raman scattering, reflectivity and photoluminescence measurements of t
he porous silicon layers prepared on (001) p/p(+) silicon epitaxial wa
fers by anodization method are presented. We have studied dependence o
f the frequency shift and halfwidth of LO mode in Raman spectra and sh
ift of the luminescence peak in photoluminescence spectra vs. anodizat
ion conditions.