PHOTOLUMINESCENCE, REFLECTIVITY AND RAMAN INVESTIGATIONS OF NANOCRYSTALLITES IN LUMINESCENT POROUS SILICON

Citation
W. Bala et al., PHOTOLUMINESCENCE, REFLECTIVITY AND RAMAN INVESTIGATIONS OF NANOCRYSTALLITES IN LUMINESCENT POROUS SILICON, Acta Physica Polonica. A, 87(2), 1995, pp. 445-448
Citations number
10
Categorie Soggetti
Physics
Journal title
ISSN journal
05874246
Volume
87
Issue
2
Year of publication
1995
Pages
445 - 448
Database
ISI
SICI code
0587-4246(1995)87:2<445:PRARIO>2.0.ZU;2-3
Abstract
Raman scattering, reflectivity and photoluminescence measurements of t he porous silicon layers prepared on (001) p/p(+) silicon epitaxial wa fers by anodization method are presented. We have studied dependence o f the frequency shift and halfwidth of LO mode in Raman spectra and sh ift of the luminescence peak in photoluminescence spectra vs. anodizat ion conditions.