DIFFUSE-X-RAY-SCATTERING MEASUREMENTS OF ROUGHNESS ON ION-ETCHED MULTILAYER INTERFACES

Authors
SCHLATMANN R SHINDLER JD VERHOEVEN J
Citation
R. Schlatmann et al., DIFFUSE-X-RAY-SCATTERING MEASUREMENTS OF ROUGHNESS ON ION-ETCHED MULTILAYER INTERFACES, Physical review. B, Condensed matter, 51(8), 1995, pp. 5345-5351
Citations number
35
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
51
Issue
8
Year of publication
1995
Pages
5345 - 5351
Database
ISI
SICI code
0163-1829(1995)51:8<5345:DMOROI>2.0.ZU;2-L