An inverse radiation analysis for simultaneous estimation of the singl
e scattering albedo, the optical thickness and the phase function, fro
m the knowledge of the exit radiation intensities is presented. A gene
tic algorithm is adopted as the optimizer to search the parameters of
the radiation system. The study shows that the single scattering albed
o and the optical thickness can be estimated accurately even with nois
y data. The estimation of the phase function is more difficult than th
at of the single scattering albedo and the optical thickness. Copyrigh
t (C) 1996 Elsevier Science Ltd.