STRUCTURE OF THIN-FILMS OF TITANIUM NITRIDE

Authors
Citation
V. Valvoda, STRUCTURE OF THIN-FILMS OF TITANIUM NITRIDE, Journal of alloys and compounds, 219, 1995, pp. 83-87
Citations number
10
Categorie Soggetti
Chemistry Physical","Metallurgy & Metallurigical Engineering","Material Science
ISSN journal
09258388
Volume
219
Year of publication
1995
Pages
83 - 87
Database
ISI
SICI code
0925-8388(1995)219:<83:SOTOTN>2.0.ZU;2-J
Abstract
The micro- and picostructures of TiN films deposited by magnetron sput tering are compared with their properties and deposition conditions. T he transition from porous to compact films and the changes in their mi crohardness, lattice parameters and microstrains are controlled by the temperature of deposition, gas pressure and energy of ion bombardment . The extended crystallographic anisotropy of inhomogeneous lattice de formations is a new phenomenon in which thin polycrystalline films dif fer from bulk stress-free materials.