THE MICROWAVE MEASUREMENTS OF (N-2)(X)AR-1-X SOLID-SOLUTIONS

Citation
W. Kempinski et J. Stankowski, THE MICROWAVE MEASUREMENTS OF (N-2)(X)AR-1-X SOLID-SOLUTIONS, Fizika nizkih temperatur, 21(1), 1995, pp. 97-101
Citations number
42
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
01326414
Volume
21
Issue
1
Year of publication
1995
Pages
97 - 101
Database
ISI
SICI code
0132-6414(1995)21:1<97:TMMO(S>2.0.ZU;2-W
Abstract
A full range of solid solutions (N-2)(x)Ar-1-x (0 < x < 1) have been e xamined with an x-band microwave dielectrometer. The real part of the permittivity epsilon' versus temperature T for this non-polar system h as been measured with a high accuracy (10(-6)) at temperatures between 1.5-75 K. A comparative (x, T) phase diagram is constructed with a be ta-alpha structural phase transition and the problem of transition to the orientational glass is discussed.